Semiconductor Integrated Device & Process Lab.

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Journals

1

Subthreshold Bias-Induced Threshold Voltage Shift of the Ovonic Threshold Switch / Sanghyun Ban, Jangseop Lee, Yoori Seo, Ohhyuk Kwon, Wootae Lee, Taehoon Kim, Hyunsang Hwang / IEEE Electron Device Letters, 45(1), pp. 128–131 (202401) 

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