Semiconductor Parameter Analyzers (Agilent B1500)
Conductive-Atomic Force Microscope
Photo Lithography System (MDA-400M)
Rapid Thermal Annealing (RTA)
Reactive Ion Etcher (RIE)
High Pressure Equipment (Small Chamber,2")
Atomic Layer Deposition (ALD) System
RF Magnetron Reactive Sputtering System