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작성일 : 17-11-17 18:46
[2017]
 글쓴이 : 차미경
Automatic ReRAM SPICE Model Generation From Empirical Data for Fast ReRAM-Circuit Coevaluation / Jaehyun Seo, Sangheon Lee, Kwangmin Kim, Student Member, IEEE, Sooeun Lee, Student Member, IEEE, Hyunsang Hwang, Senior Member, IEEE, and Byungsub Kim, Senior Member, IEEE / IEEE Transactions on Very Large Scale Integration (VLSI) Systems 25(6),7840076, pp. 1821-1830 (201706)