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Effects of Liner Thickness on the Reliability of AgTe/TiO2-Based Threshold Switching Devices / Jeonghwan Song, Jiyong Woo, Jongmyung Yoo, Solomon Amsalu Chekol, Seokjae Lim, Changhyuck Sung, and Hyunsang Hwang / IEEE Transactions on Electron Devices Volume 64 Issue 11, pp.4763 - 4767 (201709)
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